Time slots
Session 1 (English): 9 am CET (Berlin, Germany)Session 2 (English): 5 pm CET (Berlin, Germany)
Find the Leak. Save the Yield – Semiconductor Leak Detection
Learn how to efficiently detect leaks throughout semiconductor fabs, from cleanrooms to basement utility areas. Discover practical methods to improve reliability, reduce risk, and safeguard yield.
Session 2 (English): 5 pm CET (Berlin, Germany)
Speakers
- Thomas Bertholio, Business Development - Leak Detection
- Edouard Guillaume, Global Business Coordination Manager
What is the webinar about?
Leaks in semiconductor fabs can compromise process stability, increase operating costs, and ultimately impact yield. Detecting and locating leaks quickly and efficiently is therefore essential, whether they occur in highly controlled cleanroom environments or within facility and utility systems in basement areas. However, achieving reliable results while minimizing downtime and helium consumption remains a common challenge.Join our leak detection specialists for a practical webinar focused on proven methods, best practices, and field-tested techniques for leak detection across the entire fab. Learn how to identify critical leak points faster, optimize troubleshooting workflows, and implement strategies that improve reliability while reducing operational risk.
Key Takeaways
- Best practices for fast and reliable leak detection in semiconductor fabs
- Practical tips and tricks to reduce troubleshooting time
- Strategies to minimize helium consumption while maintaining detection performance
- Recommendations to improve productivity, equipment reliability, and fab uptime
- Actions to reduce risk and safeguard semiconductor yield
Discover how a structured and efficient leak detection approach can help enhance operational excellence.